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FAMAS - Research project

Multi-spot Laser Fault Injection on Microcontroller

Postdoctoral fellow: Paul GRANDAMME, ED 488 SIS (Science, Engineering, Health)

ABSTRACT

The physical security of integrated circuits used in a wide range of applications, from smartcards to automotive and smartphones, is a major challenge for society, both because of privacy and security issues. The security of these systems must be evaluated by using high-end techniques, exploiting complex attack paths to be able to anticipate future cyberattacks on hardware. In this framework, the FAMAS project aims at highlighting the possibilities offered by a 4-spot laser fault injection setup, developed by a French company named ALPhANOV, to address the limitations of single-spot setups. Indeed, these are limited by the spatial locality of the faults induced in the device and by timing constraints. To do so, the FAMAS project will uncover new attack paths and means to exploit the multiple faults for cryptanalysis. The FAMAS project will focus on several hardware targets, namely micro-controllers and reconfigurable devices like FPGAs and SoC-FPGAs. We will also study countermeasures against the aforementioned attacks.




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